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System and method for scanning a pulsed laser beam
专利权人:
Ruben Zadoyan;Guy V. Holland;Marcel Bouvier;Ferenc Raksi
发明人:
Ferenc Raksi,Ruben Zadoyan,Marcel Bouvier,Guy V. Holland
申请号:
US11968589
公开号:
US09108270B2
申请日:
2008.01.02
申请国别(地区):
US
年份:
2015
代理人:
摘要:
System and method of photoaltering a region of a material using a pulsed laser beam. The method includes scanning the pulsed laser beam in a first portion of the region with a first pattern, scanning the pulsed laser beam in a second portion of the region with a second pattern, and separating a flap of the material at the region. The system includes a laser, a controller selecting at least first and second patterns, and a scanner operable in response to the controller. The first pattern has a first maximum acceleration associated with the second portion, and the second pattern has a second maximum acceleration associated with the second portion. The second maximum acceleration is less than the first maximum acceleration. The scanner scans the pulsed laser beam from the laser in the first portion with the first pattern and in the second portion with the second pattern.
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