A system comprising a scintillation layer configured to (i) receive x-rays emitted from an x-ray source, and (ii) convert the x-rays to light； a plurality of microelectromechanical scanners configured to (i) detect corresponding portions of the light, and (ii) generate respective signals； a scanning module configured to actuate each of the plurality of microelectromechanical scanners, wherein each of the signals is generated based on the actuation of the corresponding one of the plurality of microelectromechanical scanners； and a processor configured to generate an image based on the signals, wherein each of the signals contributes to a corresponding portion of the image.
