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Methods of Lag-Compensation for Analyte Measurements, and Devices Related Thereto
专利权人:
发明人:
Erwin S. Budiman,David L. Li
申请号:
US15289776
公开号:
US20170095213A1
申请日:
2016.10.10
申请国别(地区):
US
年份:
2017
代理人:
摘要:
In some aspects, methods of lag compensation of analyte measurements are provided. Methods of lag-compensation are provided for analyte point measurements and/or for analyte rate-of-change measurements. The methods include receiving a series of uncompensated analyte measurements and determining parameter values for analyte point and/or rate-of-change estimates based on reference analyte measurements. The analyte rate-of-change estimate is based on a sum of a plurality of scaled rates-of-changes. The analyte point estimate is based on a sum of an analyte point and a sum of a plurality of scaled rates-of-changes. Devices related to the methods are also provided.
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