Peter Munro;Konstantin Ignatyev;Alessandro Olivo;Robert Speller
发明人:
Peter Munro,Alessandro Olivo,Konstantin Ignatyev,Robert Speller
申请号：
US14233050
公开号：
US09164045B2
申请日:
2012.07.19
申请国别(地区):
US
年份:
2015
代理人:
摘要：
A method of phase imaging uses X-ray beams having edges overlapping with pixels. A phase image may be obtained from first and second images using one or more X-ray beam, the first image being measured with the first edge but not the second edge of each X-ray beam overlapping the corresponding pixel(s) and the second image being measured with the second edge but not the first edge overlapping the corresponding pixel(s). The gradient of the X-ray absorption function may be calculated and a proportional term included in the image processing to calculate a quantitative phase image.
