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MEASUREMENT APPARATUS AND DETECTION DEVICE
专利权人:
SEIKO EPSON CORPORATION
发明人:
Taki HASHIMOTO,Ayae SAWADO
申请号:
US15437724
公开号:
US20170251963A1
申请日:
2017.02.21
申请国别(地区):
US
年份:
2017
代理人:
摘要:
A measurement apparatus includes a first light emission unit that emits light having a first wavelength, a second light emission unit that emits light having a second wavelength of which an arrival depth with respect to a measurement site exceeds the arrival depth of the light having the first wavelength, a light reception unit that generates a detection signal corresponding to a light reception level of light arriving from the measurement site, and an analysis unit that acquires biological information corresponding to the detection signal. The first light emission unit, the second light emission unit, and the light reception unit are installed on a detection surface facing the measurement site, and a distance between the first light emission unit and the light reception unit exceeds a distance between the second light emission unit and the light reception unit.
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