Klaus Koerner,Daniel Claus,Alois Herkommer,Wolfgang Osten
申请号:
US14936048
公开号:
US20160143539A1
申请日:
2015.11.09
申请国别(地区):
US
年份:
2016
代理人:
摘要:
Disclosed herein is a measuring probe, an apparatus, and a method for infrared spectroscopy. In some embodiments the measuring probe may have an elongated form with a first end for coupling and decoupling infrared light into and out of the measuring probe and a second end. In other embodiments, the measuring probe may comprise an attenuated total reflection (ATR) prism arranged at the second end of the measuring probe. The ATR prism may include at least a first surface having at least one measuring portion configured to be brought in optical contact with a measured object. The ATR prism may include at least a second surface having at least one reflective portion. In some embodiments, the ATR prism may include a cutting portion for cutting through the measured object.