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X-ray tube predictive fault indicator sensing device, X-ray tube predictive fault indicator sensing method, and X-ray imaging device
专利权人:
Ltd.;Hitachi
发明人:
Takashi Nakahara,Shinya Yuda,Takanori Aono,Tetsu Inahara,Yoshitaka Seki,Kouji Akita,Kiyomi Abe
申请号:
US15313982
公开号:
US10098215B2
申请日:
2015.04.27
申请国别(地区):
US
年份:
2018
代理人:
摘要:
A learning unit in learning mode generates a cluster from a cluster analysis of data formed from frequency constituent data and state data, obtained from a sensor unit. An abnormality calculation unit computes, as abnormalities, the minimum values among distances to surfaces of the clusters of the data formed from the frequency constituent data and the state data, obtained when in predictive fault indicator sensing mode. A predictive fault indicator determination unit determines a predictive fault indicator of an X-ray tube by comparing the abnormalities with a predetermined threshold.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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