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Test strip
专利权人:
LRE TECHNOLOGY PARTNER GMBH
发明人:
MARKART, ERNST
申请号:
US19980040062
公开号:
US5904898(A)
申请日:
1998.03.17
申请国别(地区):
美国
年份:
1999
代理人:
摘要:
In a test strip package having a plurality of test strips (20), each of which test strips has a test field (32) for evaluation by an optical measuring mechanism of a measuring device and including a container (12) for receiving the test strips (20) the container (12) is made as a rectangular closed flat envelope (12) for receiving a rectangular card (18), with the card (18) consisting of a plurality of test strips (20) which are separable from one another along tear lines (22). The measuring device comprises a device housing (38) with a test strip support surface (40) as well as a measuring optic system, an evaluation and control circuit and an indicator unit (42) contained in the housing, with the test strip surface (40) having a stop (44) for reception in a recess (30) in the envelope (12) as well as a stop (46) which is so positioned relative to the measuring optic system that upon the placement of a predetermined spot of a test strip (20) onto the stop (46) the test field (32) of the test strip (20) lies in the area of the measuring beam of the measuring optic system.
来源网站:
中国工程科技知识中心
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