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STRESS MEASURING DEVICE AND METHOD
专利权人:
发明人:
DE VRIES JAN JOHANNES GERARDUS,OUWERKERK MARTIN
申请号:
IN8629/CHENP/2013
公开号:
IN2013CN08629A
申请日:
2013.10.25
申请国别(地区):
IN
年份:
2014
代理人:
摘要:
The present invention relates to a stress measuring device (10) and method for determining a level (15) of stress of a user (1) in particular long term stress. The stress measuring device (10) comprises an input interface (12) for receiving a skin conductance signal (11) indicating the skin conductance of the user (1) the skin conductance signal (11) over time forming skin conductance trace data (13). The stress measuring device (10) further comprises a processing unit (14) for processing the skin conductance trace data (13) the processing unit (14) adapted to determine over at least a portion of the skin conductance trace data (13) values of a rise time (tr) between at least two different points of the skin conductance trace data (13) to determine a frequency distribution of the rise time (tr) values and to determine the level (15) of stress of the user (1) based on the determined frequency distribution.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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