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Apparatus and methods for determination of the half value layer of X-ray beams
专利权人:
George W. Burkett, Jr.;Sarah E. McKenney;John M. Boone
发明人:
John M. Boone,George W. Burkett, Jr.,Sarah E. McKenney
申请号:
US13550502
公开号:
US09008264B2
申请日:
2012.07.16
申请国别(地区):
US
年份:
2015
代理人:
摘要:
Described is an apparatus for use in HVL measurement as well as methods of making measurements. One version of the apparatus is a cage structure having a central axis and a central opening defined by a filter encircling the central axis, with the filter having a thickness that varies peripherally around said central axis. The filter can be formed from multiple spaced-apart plates having varying thicknesses or can be formed from a cylinder having a continuously increasing thickness.
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