超音波検査装置
- 专利权人:
- 澁谷工業株式会社
- 发明人:
- 小関 良治
- 申请号：
- JP2008096741
- 公开号：
- JP5273349B2
- 申请日:
- 2008.04.03
- 申请国别(地区):
- JP
- 年份:
- 2013
- 代理人:
- 摘要：
PROBLEM TO BE SOLVED: To provide a compact ultrasonic inspection apparatus providing images of high resolution.
SOLUTION: The ultrasonic inspection apparatus is provided with a sensor part 5 whose distal end part is hemispherical. On the surface part of the sensor part 5, a plurality of axial direction electrodes Y1-Y36 are disposed on the inner layer side, and annular electrodes X1-X9 are disposed on the outer layer side. Ultrasonic vibrators 6 are respectively disposed at parts to be the intersections of the axial direction electrodes Y1-Y36 and the annular electrodes X1-X9. When driving the ultrasonic vibrator 6 of EG1 for instance, the axial direction electrode Y1 and the annular electrode X1 are selected, a voltage is applied to the ultrasonic vibrator 6 of the EG1 from them and causes the ultrasonic vibrator 6 to oscillate ultrasonic waves.
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- 来源网站：
- 中国工程科技知识中心
