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ÉTALONNAGE DE GAIN STATIQUE
专利权人:
Koninklijke Philips N.V.
发明人:
申请号:
EP19168386.1
公开号:
EP3721809A1
申请日:
2019.04.10
申请国别(地区):
EP
年份:
2020
代理人:
摘要:
An X-ray system (1, 10) for imaging and a gain calibration method are disclosed. An assembly (4, 14) of the system is moveable to different scan coordinates to acquire X-ray projection images at a plurality of said scan coordinates in a dynamic mode while the assembly is moving. The assembly is also moveable to a predetermined reference coordinate to acquire an X-ray projection image at said reference coordinate in a static mode while the assembly is resting. At least one processing unit (5), comprised by the X-ray system, is configured for receiving a plurality of dynamic gain calibration parameters as first inputs, for obtaining a static gain calibration parameter as a second input and for determining a plurality of adjusted dynamic gain calibration parameters. Each dynamic gain calibration parameter is obtained from an X-ray projection image acquired in the dynamic mode at one of the scan coordinates. The static gain calibration parameter is obtained from an X-ray projection image acquired in the static mode at the predetermined reference coordinate.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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