PROBLEM TO BE SOLVED: To provide an X-ray imaging apparatus using SDG, for reducing unnecessary components caused by a transmittance distribution of an object and unevenness in irradiation by a light source and accurately calculating a differential phase.SOLUTION: The X-ray imaging apparatus includes: a diffraction grating for diffracting X-ray to form an interference pattern a shielding grating where an X-ray shielding portion and an X-ray transmitting portion are arranged a detector an arithmetic operation unit and a moving unit for moving the diffraction grating and the shielding grating. The interference pattern and the diffraction grating can take a first relative position such that the shielding portion of the shielding grating shields a half of the light portion of the interference pattern, and a second relative position shifted from the first position by a width of the shielding portion of the shielding grating in a direction of a period of the shielding grating. The detector detects an X-ray intensity distribution while the diffraction grating and the shielding grating are moved by the moving unit with the interference pattern and the shielding grating keeping the first relative position, and while the diffraction grating and the shielding grating are moved by the moving unit with the interference pattern and the shielding grating keeping the second relative position. The arithmetic operation unit calculates phase information of an object based on the two X-ray intensity distributions.COPYRIGHT: (C)2011,JPO&INPIT【課題】被検体の透過率分布と光源の照明むらに起因した不要な成分を減じ、精度良く微分位相を算出することができるSDG法を用いたX線撮像装置を提供する。【解決手段】X線撮像装置は、X線を回折して干渉パターンを形成する回折格子と、X線の遮蔽部と透過部が配列した遮蔽格子と、検出器と、演算部と、回折格子と遮蔽格子を移動させる移動部を備え、干渉パターンと遮蔽格子は、遮蔽格子の遮蔽部が干渉パターンの明部の半分を遮蔽する第1の相対位置と、第1の相対位置から遮蔽格子の周期方向に遮蔽格子の遮蔽部の幅の長さずれた第2の相対位置をとり、検出器は、干渉パターンと遮蔽格子が第1の相対位置を保ちつつ移動部によって回折格子と遮蔽格子が移動している間と第2の相対位置を保ちつつ移動部によって回折格子と遮蔽格子が移動している間にX線強度分布を検出し、演算部は2つのX線強度分布に基づいて被検体の位相情報を算出する。【選択図】 図1
