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Apparatus and method for calculating scattered line intensity, and scattering line intensity calculation method
专利权人:
朝日レントゲン工業株式会社
发明人:
正岡 聖
申请号:
JP2018137474
公开号:
JP6663094B2
申请日:
2018.07.23
申请国别(地区):
JP
年份:
2020
代理人:
摘要:
Problem to be solved: to provide a scattering line intensity calculating device applicable to an arbitrary subject organism.The scattering line intensity calculating apparatus comprises a storage section and a calculating section.Said storage sectionThe ratio of the calculated results of the scattered radiation intensity to the total radiation intensity in a particular frame of a particular pixel position on the detector used in radiography of the subjectA curved parameter indicating the relationship of the total radiation intensity ratio detected at the particular pixel position to the total radiation intensity detected at the particular pixel position in the above described frame with respect to the total radiation intensity detected at the particular pixel position in the particular frame .The calculating section calculates the ratio of the scattered radiation intensity to the total radiation intensity or direct radiation intensity detected by X-ray imaging of the subject in the particular frame of the particular pixel position using the curve equation.Diagram
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