光構造解析装置及びその作動方法
- 专利权人:
- テルモ株式会社
- 发明人:
- 寺村 友一
- 申请号：
- JP2009017081
- 公开号：
- JP5405842B2
- 申请日:
- 2009.01.28
- 申请国别(地区):
- JP
- 年份:
- 2014
- 代理人:
- 摘要：
PROBLEM TO BE SOLVED: To easily and accurately extract a layer structure, especially a closed curve layer structure.
SOLUTION: A signal processing part 93 includes, a tomographic structure image generation part 930, an image storage part 931 as a storage means, a noise processing part 932, an A line group setting part 933, a B line group setting part 934, a signal strength extraction part 935, a change amount comparison part 936, a marking part 937, a line interpolation part 938, a closed curve layer structure extraction part 939, a pattern comparison part 940, a pattern storage part 941, a structure abnormality determination part 942, and a rendering part 943.
COPYRIGHT: (C)2010,JPO&INPIT
- 来源网站：
- 中国工程科技知识中心
