画像解析装置、その計測方法及びプログラム
- 专利权人:
- キヤノン株式会社
- 发明人:
- ▲高▼間 康文
- 申请号：
- JP2009199018
- 公开号：
- JP5669372B2
- 申请日:
- 2009.08.28
- 申请国别(地区):
- JP
- 年份:
- 2015
- 代理人:
- 摘要：
PROBLEM TO BE SOLVED: To provide technology for determining a direction of layer-thickness measurement based on tilting and bending of the layer, and measuring layer-thickness along the direction.
SOLUTION: The image analyzer for measuring layer-thickness of each section in a tomographic image, receives tomographic images, extracts borders of layers from the plurality of received tomographic images, sets a plurality of reference points on borders of the layers, calculates a direction of layer-thickness measurement on each of the set reference points and measures layer-thickness along the measurement directions from the respective plurality of reference points.
COPYRIGHT: (C)2011,JPO&INPIT
- 来源网站：
- 中国工程科技知识中心
