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Skin condition measurement analysis information management system and skin condition measurement analysis information management method
专利权人:
日立マクセル株式会社
发明人:
楠本 文恵,吉村 雅志,坂田 栄二,長野 広信,松岡 建志,三浦 健吾
申请号:
JP2016003499
公开号:
JP6174725B2
申请日:
2016.01.12
申请国别(地区):
JP
年份:
2017
代理人:
摘要:
Service can be offered free of charge and the cost of a skin condition measuring device can be reduced by effectively using data on the occasion of obtaining an analysis result by transmitting measurement data by the skin condition measuring device to a server of a company providing a service of analyzing the measurement data. When a request is made from a contractor client to acquire data registered in a measurement data database, authentication is executed based on a contractor ID input from the contractor client. Additionally, when the measurement data database is searched from a contractor database based on the contractor ID, a search level and an access level are obtained. The contractor client is permitted to search the measurement data database within a range of the search level and the access level.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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