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X-RAY PHASE IMAGING APPARATUS
专利权人:
Shimadzu Corporation
发明人:
Koichi TANABE,Kenji KIMURA,Toshinori YOSHIMUTA,Taro SHIRAI,Takahiro DOKI,Satoshi SANO,Akira HORIBA,Naoki MORIMOTO
申请号:
US15958188
公开号:
US20180306735A1
申请日:
2018.04.20
申请国别(地区):
US
年份:
2018
代理人:
摘要:
The X-ray phase imaging apparatus includes a position switching mechanism for switching a relative position of one or more gratings between a retreated position which is an outside of a detection range on a detection surface of an image signal detector and a detection positon which is an inside of the detection range on the detection surface of the image signal detector and a focal diameter changing unit configured to change a focal diameter of the X-ray source in conjunction with switching of the relative position of the one or more gratings.
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