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HIGH ACCURACY ION MOBILITY SPECTROMETRY
专利权人:
Washington State University
发明人:
Hauck Brian,Siems William,McHugh Vincent,Harden Charles S.,Hill, JR. Herbert H.
申请号:
US201816005337
公开号:
US2018372683(A1)
申请日:
2018.06.11
申请国别(地区):
美国
年份:
2018
代理人:
摘要:
Ion mobility spectrometry (IMS) systems, devices, and associated methods of operation are disclosed herein. In one embodiment, an IMS system includes an ionization region configured to receive and ionize a sample into ionized molecules and a detector configured to detect ionized molecules. The IMS system also includes a drift region in between and directly coupled to both the ionization region and the detector. The drift tube includes a first ion gate proximate the ionization region and a second ion gate proximate the detector. The first and second ion gates are configured to alternately introduce a batch of ionized molecules toward the detector while the other is maintained open, thereby allowing accurate measurement of a drift time of the ionized molecules corresponding to a drift length that is a distance between the first and second ion gates.
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