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Eddy current flaw detection device, eddy current flaw detection method, and eddy current flaw detection program
专利权人:
KABUSHIKI KAISHA TOSHIBA
发明人:
Kobayashi Noriyasu,Ueno Souichi,Ichikawa Hiroya
申请号:
US201414781851
公开号:
US10001458(B2)
申请日:
2014.03.14
申请国别(地区):
美国
年份:
2018
代理人:
Oblon, McClelland, Maier & Neustadt, L.L.P.
摘要:
There is provided an eddy current flaw detection technique capable of, even when inspecting an object having a narrow portion with a small curvature radius, recognizing detection sensitivity change due to change of attitude of a probe.;An eddy current flaw detection apparatus 10 includes: an AC power source 14 which generates an excitation magnetic field in each of excitation coils 12a accommodated in a probe 11 to excite an eddy current in an inspection object 13; a detecting section 15 which detects a detection signal generated by an induction magnetic field induced by the eddy current in each of detection coils 12 accommodated in the probe 11; an output section 16 which outputs flaw detection data based on the detection signals; a storage section 17 which mutually associates and stores the detection signals detected at the same timing from the plurality of coils 12b; and an evaluating section 18 which evaluates an attitude of the probe 11 based on the plurality of detection signals detected at the same tim
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