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眼科装置
专利权人:
株式会社ニデック
发明人:
滝井 通浩
申请号:
JP2006182844
公开号:
JP4948922B2
申请日:
2006.06.30
申请国别(地区):
JP
年份:
2012
代理人:
摘要:

PROBLEM TO BE SOLVED: To provide an ophthalmologic apparatus capable of projecting a slit luminous flux without interposing a nozzle for intraocular pressure measurement, accurately obtaining a cornea cross section image in a wide range and measuring a cornea thickness.

SOLUTION: In the ophthalmologic apparatus comprising an intraocular pressure measuring means for measuring the intraocular pressure of an eye to be examined and a cornea thickness measuring means for projecting a luminous flux to the cornea of the eye to be examined, detecting the reflected light and measuring the thickness of the cornea, the cornea thickness measuring means comprises: a projection optical system having a slit and a projection lens for projecting the slit luminous flux to the cornea of the eye to be examined from a first axis in the oblique direction of the eye to be examined, for which the slit and the projection lens are arranged on the basis of the Scheimpflug principle and a detection optical system having a photographing lens and an imaging element for detecting a slit cross section image projected to the cornea of the eye to be examined from a second axis in the oblique direction of the eye to be examined, for which the photographing lens and the imaging element are arranged on the basis of the Scheimpflug principle relative to the slit cross section image.

COPYRIGHT: (C)2008,JPO&INPIT

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