您的位置: 首页 > 农业专利 > 详情页

AUTOMATED IMPLANT MOVEMENT ANALYSIS SYSTEMS AND RELATED METHODS
专利权人:
Sectra AB
发明人:
Olof Sandberg,Claes Lundström
申请号:
US16752799
公开号:
US20200258220A1
申请日:
2020.01.27
申请国别(地区):
US
年份:
2020
代理人:
摘要:
Methods, systems, workstations, and computer program products that provide automated implant analysis of batches of image data sets of a plurality of different patients having an implant coupled to bone using a first data set of a first patient from the batch of image data sets, the first data set comprising a first image stack and a second image stack and allowing a user to select parameter settings for implant movement analysis of the implant including selecting a first object of interest and a second reference object. Measurements of movement of the implant and/or coupled bone can be automatically calculated and selected parameter settings can be automatically propogated to other image data sets of other patients of the batch of image data sets and measurements for the batch of image data sets of others of the different patients can be automatically calculated.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充