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Slit lamp microscope
专利权人:
TAKAGI SEIKO CO.; LTD.
发明人:
Tomoyuki Nakamura,Shigeo Kanazawa,Takeshi Nara
申请号:
US15699497
公开号:
US10444484B2
申请日:
2017.09.08
申请国别(地区):
US
年份:
2019
代理人:
摘要:
The slit lamp microscope comprises: a slit light optical system including a slit lamp, and a reflecting mirror or prism for reflecting a slit light from the slit lamp toward an eye of an examinee; and a microscope unit including an object lens, binocular eyepiece lenses, a magnification changing section, which changes magnifications of an image formed by light passing through the optical paths, being provided between the object lens and the eyepiece lenses, and an inward angle changing section, which changes a binocular viewing angle, being provided therebetween. A focal distance of the object lens is made shorter, by an optical path length of the inward angle changing section, than that of an object lens equipped with no inward angle changing section. The inward angle changing section is located closer to the object lens than to the magnification changing section.
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