您的位置: 首页 > 农业专利 > 详情页

Perio-Implant Ridge Probe
专利权人:
Brian Ehrlich
发明人:
Brian Ehrlich
申请号:
US13270424
公开号:
US20130089831A1
申请日:
2011.10.11
申请国别(地区):
US
年份:
2013
代理人:
摘要:
The invention is a tool that can measure an edentulous ridge and properly locate and or verify new planned dental implant positions. Due to the innovative design of the offset or curved shanks, the invention allows proper positioning of the Perio-Implant Ridge Probe instrument against existing teeth or implants while measuring an edentulous ridge. The invention consists of five separate design types of Perio-Implant Ridge Probes. Each type is an independent instrument with a variation in the design at the working end. The design innovation is in the design of the shank, the ridge probe, and the design of the double ended instruments. The ridge probe is calibrated with millimeter markings and colored bands delineating potential implant locations. The offset shank type design provides for measurements to be attained from either end of the ridge probe. The double ended instruments provide for improved instrument utility.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充