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OPHTHALMOLOGIC EXAMINATION APPARATUS
专利权人:
Shinko Seiki Co.; LTD
发明人:
Hiroshi YUUKI
申请号:
US16099238
公开号:
US20190209004A1
申请日:
2016.05.13
申请国别(地区):
US
年份:
2019
代理人:
摘要:
To realize highly reliable examination by means of an apparatus free of troublesome adjustment of which structure as a whole is simple. The examination contributes to early discovery of glaucoma in particular.Light emitted from a matrix-type light-emitting diose unit 12 is projected onto an eye to be examined through a liquid crystal shutter 16 and a main optical system 14. The matrix-type light-emitting diode unit 12 includes a plurality of light-emitting diodes devices 12b, 12b, . . . , 12b, of the same specifications arranged in a matrix array. The light-emitting diode devices 12b, 12b, . . . , 12b are independently controlled to form an image for use in the examination. The image includes a circular visual target 100a and a background 100b which is a remaining portion of the image. The visual target 100a flickers generally sinusoidally at a frequency between 1 Hz and 200 Hz. With this arrangement, highly reliable examination contributing to early discovery of glaucoma is realized. The structure of the apparatus as a whole is simple, and no troublesome adjustments are required.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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