您的位置: 首页 > 农业专利 > 详情页

SPEKTROGRAFISCHE MATERIALANALYSE ANHAND VON MULTIFREQUENTER INDUKTIVER MESSUNG
专利权人:
Texas Instruments Incorporated
发明人:
REITSMA, George, Pieter
申请号:
EP16747294
公开号:
EP3286558A4
申请日:
2016.02.04
申请国别(地区):
EP
年份:
2018
代理人:
摘要:
A multi-frequency inductive sensing system can be used for spectrographic material analysis of a conductive target material (such as tissue) based on electrical impedance spectroscopy. An inductive sensor can be driven with an excitation current at multiple sensor excitation frequencies (ω) to project a time-varying magnetic field into a sensing area on the surface of the target material, inducing eddy currents within the target material. The inductive sensor can be characterized by a sensor impedance Z(ω) as a function of the sensor excitation frequency (ω), and the resulting induced eddy currents. Multiple sensor impedance Zs(ω) measurements, at the multiple sensor excitation frequencies (ω), can be determined, which represent electromagnetic properties of the target material (such as permittivity ε, permeability μ, and resistivity ρ), based on the induced eddy currents. The multiple sensor excitation frequencies (ω), and corresponding multiple sensor impedance Zs(ω) measurements, can be selected for particular target penetration depths.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充