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PROCÉDÉ DE TRAITEMENT PAR ONDES DE MATIÈRE ET APPAREIL D'INSPECTION NON INVASIVE
专利权人:
Ken, Weng-Dah;Kan, Fang-Chi
发明人:
Ken, Weng-Dah,Kan, Fang-Chi
申请号:
EP17773324
公开号:
EP3436769A4
申请日:
2017.03.31
申请国别(地区):
EP
年份:
2020
代理人:
摘要:
A non-contact angle measuring apparatus includes a matter-wave and energy (MWE) particle source and a detector. The MWE particle source is used for generating boson or fermion particles. The detector is used for detecting a plurality peaks or valleys of an interference pattern generated by 1) the boson or fermion particles corresponding to a slit, a bump, or a hole of a first plane and 2) matter waves' wavefront-split associated with the boson or fermion particles reflected by a second plane, wherein angular locations of the plurality peaks or valleys of the interference pattern, a first distance between a joint region of the first plane and the second plane, and a second distance between the detector and the slit are used for deciding an angle between the first plane and the second plane.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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