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Procédés et dispositifs d'enregistrement d'ensembles de données de mesure optique d'un système optique
专利权人:
AMO Manufacturing USA; LLC
发明人:
申请号:
EP11181669.0
公开号:
EP2425762A1
申请日:
2004.06.15
申请国别(地区):
EP
年份:
2012
代理人:
摘要:
The present invention provides methods, systems and software for registering a first dataset of an object with a second dataset of an object. In one embodiment, the present invention measurers refractive errors of an optical system. The method comprises obtaining a first and second optical measurement of the optical system. The first and second optical measurements are registered with each other and may improve the diagnosis and/or treatment of the refractive errors of the optical system. In one embodiment, the first optical measurement is a topographical map and the second optical measurement is a wavefront measurement.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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