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FINE NEEDLE ELASTOGRAPHY DEVICE AND SYSTEM FOR THE MEASUREMENT OF MATERIAL PROPERTIES
专利权人:
James K. GIMZEWSKI
发明人:
James K. Gimzewski,Shivani Sharma,Paul R. Wilkinson,Nagesh Ragavendra,JianYu Rao,M. Dayan J. Wickramaratne
申请号:
US15503371
公开号:
US20170231499A1
申请日:
2015.08.10
申请国别(地区):
US
年份:
2017
代理人:
摘要:
In one aspect, an elastography system includes an elastography device and a position sensing device connected to the elastography device. The elastography device includes a housing, a probing element removably attached to the housing, and a force sensor attached within the housing, where the force sensor is connected to the probing element. In another aspect, an elastography) method includes inserting a probing element into a material, producing, by a force sensor connected to a base of the probing element a signal indicative of a force applied to the probing element upon insertion of the probing element into the material, and based on the signal, deriving a mapping of spatial variations of a material property within the material.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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