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Crop yield prediction method and system based on low-altitude remote sensing information from unmanned aerial vehicle
专利权人:
Zhejiang University
发明人:
LIU, Fei,KONG, Wenwen,HE, Yong,ZHOU, Jun,GUO, Han,SHEN, Jiangang
申请号:
AU2020101709
公开号:
AU2020101709A4
申请日:
2020.08.07
申请国别(地区):
AU
年份:
2020
代理人:
摘要:
#$%^&*AU2020101709A420200917.pdf#####ABSTRACT The present invention relates to a crop yield prediction method and system based on low-altitude remote sensing information from an unmanned aerial vehicle (UAV). The method includes: obtaining a plurality of images taken by the UAV, where the UAV uses a multi-spectral camera to shoot crop canopies to obtain reflection spectrum images of a plurality of different bands; stitching the plurality of images to obtain a stitched image; performing spectral calibration on the stitched image to obtain the reflectivity of each pixel in the stitched image; using a threshold segmentation method to segment the stitched image, to obtain a target area for crop yield prediction; using a Pearson correlation analysis method to analyze a correlation between the reflectivity of each band and the growth status and yield of the crop to obtain feature bands; constructing yield prediction factors based on the feature bands; and determining a predicted crop yield value of the target area for crop yield prediction based on the yield prediction factors and a crop planting area of the target area for crop yield prediction. The present invention can improve the accuracy of crop yield prediction and reduce labor intensity.1/5 DRAWINGS 100 Obtain a plurality of images taken by a UAV 200 Stitch the plurality of images to obtain a stitched image 300 Perform spectral calibration on the stitched image based on a calibration coefficient of a spectral calibration plate to obtain the reflectivity of each pixel in the stitched image 1 _400 Use a threshold segmentation method to segment the stitched image based on the reflectivity of each pixel, to obtain a target area for crop yield prediction 41 500 Use a Pearson correlation analysis method to analyze a correlation between the reflectivity of each band and the growth status and yield of the crop to obtain feature bands 600 Construct yield pr
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