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Magnetic resonance imaging apparatus, magnetic resonance imaging method, and magnetic susceptibility calculation program
专利权人:
株式会社日立製作所
发明人:
佐藤 良太,白猪 亨,谷口 陽,尾藤 良孝,越智 久晃,五月女 悦久
申请号:
JP2016104358
公开号:
JP6608764B2
申请日:
2016.05.25
申请国别(地区):
JP
年份:
2019
代理人:
摘要:
Accuracy degradation due to a signal loss is reduced, and susceptibility is calculated with high accuracy where, by using an MRI, at least one echo is acquired where spatial magnetic field inhomogeneity is reflected, and a complex image is calculated from the acquired echo. Three masks are calculated from the calculated complex image; a low-signal region mask representing a low signal region, a first high-signal region mask representing a high signal and high fat content region, and a second high-signal region mask representing a high signal and low fat content region. In calculating a susceptibility image from a frequency image or a magnetic field image generated from the complex image, the susceptibility image is obtained under the constraint that a region defined by the low-signal region is set as a background and the susceptibility of the region defined by the second high-signal region mask is set to a specific value.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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