粒子固定用構造体、粒子解析装置、及び解析方法
- 专利权人:
- 发明人:
- 申请号：
- JP20100150520
- 公开号：
- JP5720129(B2)
- 申请日:
- 2010.06.30
- 申请国别(地区):
- 日本
- 年份:
- 2015
- 代理人:
- 摘要：
PROBLEM TO BE SOLVED: To provide a technology capable of reducing back ground noise or cross talk noise, and carrying out the optical observation of a large number of fine particles with high sensitivity and high accuracy.
SOLUTION: A particle fixing structure 14 has a plurality of holding holes 9 respectively holding inspected particles for detecting light emitted from substances indicating the existence of ingredients constituting the inspected particles, and comprises a platy base plate 15, and a holding portion 20 disposed on the base plate 15 and formed with a plurality of the holding holes 9. The holding portion 20 has a light shielding film 19 provided at least on an upper surface side of the holding portion, and an insulator film 18 provided between the light shielding film and the base plate 15. The holding holes 9 open on the light shielding film 19 positioned on the upper surface side of the holding portion 20, and extend to the base plate 15 through the insulator film 18.
COPYRIGHT:
- 来源网站：
- 中国工程科技知识中心
