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grading device, sorting device, method of classifying at least one plant specimen, screening method for tracking growing conditions, use of the sorting device and rapid strain resistance analysis method of growing plant specimens
专利权人:
BASF PLANT SCIENCE COMPANY GMBH
发明人:
CEDRIK VANDAELE,FABIO FIORANI,FREDERIK LEYNS,JEROEN BAERT,PIERRE LEJEUNE
申请号:
BR112013030649
公开号:
BR112013030649A2
申请日:
2012.06.25
申请国别(地区):
BR
年份:
2016
代理人:
摘要:
A screening device (110) for screening at least one plant specimen (112) in a plurality of plant specimens (114) is disclosed. The screening device (110) comprises a detector (116) adapted for acquiring spatially resolved images (117). The screening device (110) further comprises at least one selection device (118) adapted for selecting a single plant specimen (120) or a group of plant specimens (122) from the plurality of plant specimens (114) for imaging by the detector (116). The selection device (118) comprises a deflection device (124) adapted for deflecting electromagnetic waves propagating between the plant specimens (112) and the detector (116).
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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