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X線CT装置
专利权人:
日立アロカメディカル株式会社
发明人:
大友 直樹,北川 茂,細部 孝,小林 正樹,山下 文明
申请号:
JP2007152787
公开号:
JP4881796B2
申请日:
2007.06.08
申请国别(地区):
JP
年份:
2012
代理人:
摘要:

PROBLEM TO BE SOLVED: To reduce the influence of cosmic rays, etc. in the calibration of an X-ray CT apparatus.

SOLUTION: In the calibration performed by actual irradiation/detection with a fan beam 12, an X-ray generator 10 and an X-ray detector 20 are disposed in the horizontal direction (in the x-axis direction). Specifically, the X-ray generator 10 and the X-ray detector 20 are moved as a rotary base 72 is rotated by a rotating mechanism 70, and the normal of the detection face of the semiconductor device array 22 is turned approximately in the horizontal direction. As the possibility of muons coming approximately in the vertical direction (in the z-axis direction) is high, the possibility of muons flying into the detection face can be reduced by turning the normal of the detection face of the semiconductor device array 22 approximately in the horizontal direction. As a result, the calibration including the detection of X rays is hardly affected by muons, etc., and therefore, the calibration can be more accurately performed.

COPYRIGHT: (C)2009,JPO&INPIT

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