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INTEGRATED DIAGNOSTIC SYSTEM
专利权人:
NIPRO DIAGNOSTICS; INC.
发明人:
NEEL, GARY,MODZELEWSKI, BRENT,CASTERLINE, CAMERON
申请号:
AT04814860
公开号:
AT553694T
申请日:
2004.12.21
申请国别(地区):
AT
年份:
2012
代理人:
摘要:
A system for diagnostic testing may include a meter (130) for performing a diagnostic test on a sample applied to a test media (120) and a container (110) configured to contain test media compatible with the meter. The meter may include a closure portion (140) for selectively closing the opening of the container. The system may further provide a sampling device (360), such as a lancet, operable connected to the container. The system may also provide mechanisms to disable a power source, an auto-on function of the meter, a diagnostic testing function of the meter, or other function of the meter when it has been determined that a triggering event has occurred. The triggering event may be, e.g., the expiration of a certain expiration of a certain time period, passage of a certain date, performance of a certain quantity of diagnostic tests, or use of a certain quantity of test media.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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