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X-RAY DIAGNOSIS APPARATUS
专利权人:
发明人:
Makoto TAKANAKA,Kunio SHIRAISHI,Shinsuke OOIE,Kentarou NISHIKAWA
申请号:
US14872348
公开号:
US20160095568A1
申请日:
2015.10.01
申请国别(地区):
US
年份:
2016
代理人:
摘要:
An X-ray diagnosis apparatus according to an embodiment includes an X-ray tube, judging circuitry, and grid controlling circuitry. The X-ray tube is configured to radiate X-rays. The judging circuitry is configured to judge whether a voltage should be applied to a grid of the X-ray tube or not, in accordance with a radiation condition. The grid controlling circuitry is configured to apply the voltage to the grid, if the judging circuitry has determined that the voltage should be applied.
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中国工程科技知识中心
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