An ultrasonic inspection apparatus includes: a probe； a transmission unit configured to cause the probe to transmit a ultrasonic beam； a reception unit configured to receive analog element signals output by the probe； an A/D conversion unit configured to perform A/D conversion on the analog element signal to obtain first element data； and a data processing unit configured to generate second element data from a plurality of the pieces of first element data, wherein the data processing unit changes conditions of acquisition of two or more of the pieces of first element data for generating the second element data depending on a depth of a position in which the second element data is obtained.
