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Method for analyzing gait pattern
专利权人:
Min Ho Kim
发明人:
Min Ho Kim,Ho Youl Jung,Jae Won Jang,Sa Kwang Song,Soo Jun Park
申请号:
US12969565
公开号:
US08261611B2
申请日:
2010.12.15
申请国别(地区):
US
年份:
2012
代理人:
摘要:
A method for analyzing a gait pattern includes: measuring, by a plurality of force sensing resistor (FSR) sensors, foot pressure values, and outputting the measured foot pressure values, respectively searching for a maximum pressure local area in which the sum of the output values from the FSR sensors included in each of a plurality of pressure local areas is maximized calculating a center of pressure (COP) with respect to the detected maximum pressure local area and analyzing a gait pattern by adding the calculated COP to the trajectory of COPs.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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