您的位置: 首页 > 农业专利 > 详情页

METHOD AND APPARATUS FOR ANALYZING SUBSURFACES OF A TARGET MATERIAL
专利权人:
发明人:
Ervin Goldfain,Raymond A. Lia
申请号:
US13971950
公开号:
US20130342826A1
申请日:
2013.08.21
申请国别(地区):
US
年份:
2013
代理人:
摘要:
A system that incorporates teachings of the present disclosure may include, for example, a method for aligning first and second light signals on an optical path directed to a target, where the first light signal provides a visualization of the target, and a portion of the second light signal reflects from at least one subsurface of the target. The method also includes aligning a first focal point of the first light signal and a second focal point of the second light signal, where the first focal point is at least in a first proximate location of the second focal point, and adjusting a first position of the first and second focal points to be in at least a second proximate location of the target without adjusting the at least first proximate location of the first focal point relative to the second focal point. Other embodiments are disclosed.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充