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A system and a method for controlling an intensity of x-rays generated by an x-ray imaging device
专利权人:
SIEMENS AG
发明人:
SAPTARSHI DAS,SAPTARSHI DAS,SATISH DUBEY,SATISH DUBEY,SORNAM VISWANATHAN VENKATESWARAN,SORNAM VISWANATHAN VENKATESWARAN
申请号:
IN118/KOL/2014
公开号:
IN2014KO00118A
申请日:
2014.01.29
申请国别(地区):
IN
年份:
2015
代理人:
摘要:
A system and a method for control-l-ing an intens:-ty of X-rays generated by an X-ray imaging device The present. invention anci the embodiments thereof relate to a system (5) and a method for control-ling an intensity of an Xray imaging device (15). An image brightness value is determined for an image (180) obtained therein and an electrical parameter thereof is determined. The image (180) obtained therein is via nonlinear attenuation of visible light (98) obtained from an X-ray detector (40) comprised in the X-ray imaging device (15). The electrj-ca1 paramet"er is thereafter provided to the x-ray imaging device (15) for 15 controlling the intensity of the generated X-rays (10).
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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