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眼科装置
专利权人:
株式会社ニデック
发明人:
滝井 通浩,本多 直人
申请号:
JP2008045679
公开号:
JP5053123B2
申请日:
2008.02.27
申请国别(地区):
JP
年份:
2012
代理人:
摘要:

PROBLEM TO BE SOLVED: To efficiently measure the thickness of the cornea and to efficiently obtain eye characteristics different from the thickness of the cornea.

SOLUTION: An ophthalmic instrument for aligning a measuring part for measuring an eye to be examined with an eye to be examined to obtain a measuring result is equipped with: a first measuring optical system, which measures the thickness of the cornea of the eye to be examined and has a projection optical system having an illumination light source for emitting visual luminous flux and projecting illumination luminous flux, which forms an optical cross-section image, on the anterior eye part of the eye to be examined and a photographing optical system for photographing the optical cross section image, which is formed on the anterior eye part of the eye to be examined by the projection optical system, through an imaging lens and a two-dimensional imaging element and a second measuring optical system for measuring the eye characteristics of the eye to be examined different from the thickness of the cornea of the eye to be examined. The projection optical system is used as a fixing visual optical system for fixedly visualizing the eye to be examined when the eye to be examined is measured by the first measuring optical system and fixedly visualizing the eye to be examined when the eye to be examined is measured by the second measuring optical system.

COPYRIGHT: (C)2009,JPO&INPIT

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