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APPARATUS AND TECHNIQUES OF NON-INVASIVE ANALYSIS
专利权人:
Sanjay Krishna
发明人:
Sanjay Krishna,Sanchita Krishna
申请号:
US13639818
公开号:
US20130023773A1
申请日:
2011.04.07
申请国别(地区):
US
年份:
2013
代理人:
摘要:
Apparatus and methods, which comprise examination of an abnormality on a subject using a temperature stimulus applied to the subject, provide a non-invasive analysis technique. In an embodiment, a non-invasive infrared imaging technique can be used to observe the temporal response of a lesion to temperature stimuli to form a basis for evaluating the abnormality. A technique including applying temperature stimuli and detecting responses to the applied temperature stimuli provide a non-invasive technique that can be used to identify an abnormality on a subject and/or characteristics of the abnormality. In an embodiment, a non-invasive transient infrared imaging technique can be used to observe the temporal response of a lesion to temperature stimuli to form a basis for determining characteristics correlated to the lesion. Additional apparatus, systems, and methods are disclosed.
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