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Multi-layer range measurement apparatus for characterizing charged particle beams
专利权人:
Pyramid Technical Consultants Inc.
发明人:
Raymond P. Boisseau,John S. Gordon,Andrew Dart,Julia C. Nett
申请号:
US15250012
公开号:
US09901751B1
申请日:
2016.08.29
申请国别(地区):
US
年份:
2018
代理人:
摘要:
A multi-layer charged particle beam characterization system is disclosed, and method for using the same. A typical embodiment includes a plurality of two-sided metal plates, arranged as a stack, each metal plate having an electrical contact tab extending from at least one common edge of the metal plate, and a plurality of insulator films disposed between adjacent metal plates, each insulator film sized to match its corresponding metal plate. The tabs are coupled to a printed circuit board and connected to an external electrical connector to register a number of metal plates and insulator layers through which a charged particle beam has penetrated.
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