Enrico C. Quintana,Kyle R. Thompson,David G. Moore,Jack D. Heister,Richard W. Poland,John P. Ellegood,George K. Hodges,James E. Prindville
申请号：
US13241569
公开号：
US08858076B2
申请日:
2011.09.23
申请国别(地区):
US
年份:
2014
代理人:
摘要：
An X-ray contrast sensitivity gauge is described herein. The contrast sensitivity gauge comprises a plurality of steps of varying thicknesses. Each step in the gauge includes a plurality of recesses of differing depths, wherein the depths are a function of the thickness of their respective step. An X-ray image of the gauge is analyzed to determine a contrast-to-noise ratio of a detector employed to generate the image.
