您的位置: 首页 > 农业专利 > 详情页

METHODS FOR CALIBRATING MICROWAVE IMAGING SYSTEMS
专利权人:
发明人:
申请号:
EP17182182.0
公开号:
EP3275367A1
申请日:
2017.07.19
申请国别(地区):
EP
年份:
2018
代理人:
摘要:
Calibration methods for microwave imaging (MI) systems are disclosed. According to an aspect, an MI system has a plurality of Vector Network Analyzer (VNA) ports operatively connected to a plurality of antennas. A multiple state calibration network having predetermined parameters is operatively connected between a first VNA port of the plurality of VNA ports and a first antenna of the plurality of antennas. A method of calibrating the MI system includes determining first, second, and third pluralities of reflection coefficients associated with the plurality of VNA ports using first, second, and third calibration scenarios removing a measurement effect of the multiple calibration network from the first, second and third pluralities of reflection coefficients and determining error parameters for each VNA port using the first, second, and third pluralities of reflection coefficients.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
相关发明人
相关专利

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充