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Apparatus and method for controlling temperature of matching material
专利权人:
发明人:
Jang Yeol Kim,Jong Moon Lee,Hyuk Je Kim,Seong Ho Son,Soon Ik Jeon
申请号:
US14561336
公开号:
US09207191B2
申请日:
2014.12.05
申请国别(地区):
US
年份:
2015
代理人:
摘要:
An apparatus and method of controlling a temperature of a matching material used in an apparatus for generating a tomographic image is disclosed. The method includes measuring a temperature of a matching material in which an object is immersed in an apparatus for measuring a shape of an object, setting a set temperature at which an amplitude and a phase of an electromagnetic wave that passes through the matching material are maintained, based on the measured temperature of the matching material, and controlling the temperature of the matching material to be higher than the set temperature.
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