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Radiation detection apparatus and radiation detection system
专利权人:
发明人:
Masato Ofuji,Minoru Watanabe,Keigo Yokoyama,Jun Kawanabe,Kentaro Fujiyoshi,Hiroshi Wayama
申请号:
US14607264
公开号:
US09277896B2
申请日:
2015.01.28
申请国别(地区):
US
年份:
2016
代理人:
摘要:
A radiation detection apparatus includes conversion elements including a first electrode, a semiconductor layer, and a second electrode that are divided for each pixel switching elements electrically connected to the first electrodes and a first insulating layer that separates the conversion elements of adjacent pixels. The semiconductor layer is located between the first and second electrodes. A periphery of the semiconductor layer is located outside peripheries of the first and second electrodes. The semiconductor layer includes a first impurity semiconductor layer, a second impurity semiconductor layer, and an intrinsic semiconductor layer located between the first and second impurity semiconductor layers. Parameters of the apparatus are defined to set a residual charge 10 μs after the switching element is turned on to be not higher than 2%.
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