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Calibration of sensors or measuring systems
专利权人:
Uwe Beyer
发明人:
Uwe Beyer,Michael Krieftewirth,Ulrich Haueter
申请号:
US11460160
公开号:
US08880371B2
申请日:
2006.07.26
申请国别(地区):
US
年份:
2014
代理人:
摘要:
A method for adjusting a sensor, continuous sensor or automatic measuring system in an interstitium including the steps of adjusting the steepness of a measuring curve and a standard offset (standard axis intercept) prior to the use of the sensor, continuous sensor or measuring system, and adapting the offset by a point calibration by using a reference measure or value during the use. The present invention encompasses sensors, continuous sensors or automatic measuring systems calibrated or adjusted in accordance with the method, and in some embodiments, the offset adjusted prior to use is rectified according to the difference between a value determined by the sensor, continuous sensor or measuring system taking into account the standard steepness and the reference value.
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