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SEMICONDUCTOR DEVICE, MEASUREMENT SYSTEM AND MEASUREMENT METHOD
专利权人:
LTD.;LAPIS SEMICONDUCTOR CO.
发明人:
Teruaki UEHARA
申请号:
US16423237
公开号:
US20190365275A1
申请日:
2019.05.28
申请国别(地区):
US
年份:
2019
代理人:
摘要:
A semiconductor device including: a signal source that generates a sine wave signal; an output section that outputs a measurement signal corresponding to the sine wave signal to a test subject via a first electrode; an input section that receives, as an input signal, the measurement signal that has passed through the test subject and been input via a second electrode; a first calculation device that calculates correlation values between the sine wave signal and the input signal; and a second calculation section that, based on the correlation values, calculates a bioelectrical impedance of the test subject.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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