您的位置: 首页 > 农业专利 > 详情页

Wavefront analysis system and focusing method thereof
专利权人:
エイエムオー・ウェーブフロント・サイエンシーズ・リミテッド・ライアビリティ・カンパニー
发明人:
ダニエル・アール・ニール,ダレル・ジェイ・アームストロング,ジェイムズ・ケイ・グルーツナー,リチャード・ジェイ・コップランド
申请号:
JP2001557456
公开号:
JP5191622B2
申请日:
2001.02.08
申请国别(地区):
JP
年份:
2013
代理人:
摘要:
A system for measuring aberrations in an eye. The system comprises: a projecting optical system (12, 14, 16, 18) producing light to be delivered onto a retina of an eye (40); an adjustable telescope (30) which compensates the light to be delivered onto the retina of the eye (40) for aberrations in the eye (40), the adjustable telescope (30) being positioned in an optical path between the projecting optical system and the eye (40); a wavefront sensor (50) receiving light returned by the retina from the imaging system and detecting an amplitude and phase of a wavefront of the received light; a target (90) that is made visible to the eye (40); a movable stage (72) on which the wavefront sensor (50), the target (90) and a movable lens (32/132) of the adjustable telescope are all mounted and are moveable with respect to a fixed lens (34/134) of the telescope to correct for defocus aberrations of the eye, and an aperture (36, 56) that blocks any rays outside the angular dynamic range of the wavefront sensor (50) so that no mixing or measurement confusion occurs.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充